Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.12202/5654| Title: | Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. |
| Authors: | Zypman, Fredy Tager, Jonathan Yehuda Yeshiva University, degree granting institution. |
| Keywords: | Senior honors thesis atomic force microscope (AFM) electrostatic force |
| Issue Date: | May-2020 |
| Publisher: | New York, NY: Yeshiva College. Yeshiva University. |
| Citation: | Tager, Jonathan Yehuda. Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. Thesis Submitted in Partial Fulfillment of the Jay and Jeanie Schottenstein Honors Program. NY: Yeshiva College Department of Physics. Yeshiva University, May 2020. [Advisor]: Professor Fredy Zypman. |
| Abstract: | In this paper we have considered the electrostatic force between a line of charge and a spherical AFM tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be used to measure, by fitting, the charge density of the line. These expressions and graphs should prove useful for an experimentalist operating an atomic force microscope. (from Conclusion) |
| Description: | Senior honors thesis. Open Access. |
| URI: | https://hdl.handle.net/20.500.12202/5654 |
| Appears in Collections: | Jay and Jeanie Schottenstein Honors Student Theses |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Tager OA Thesis May2020.pdf | Open Access | 999.71 kB | Adobe PDF |  View/Open |
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