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dc.contributor.authorOKEKE, CAJETAN EZEANI
dc.date.accessioned2018-07-12T18:01:16Z
dc.date.available2018-07-12T18:01:16Z
dc.date.issued1977
dc.identifier.citationSource: Dissertation Abstracts International, Volume: 38-09, Section: B, page: 4329.
dc.identifier.urihttps://yulib002.mc.yu.edu/login?url=http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:7732535
dc.identifier.urihttps://hdl.handle.net/20.500.12202/2445
dc.publisherProQuest Dissertations & Theses
dc.subjectCondensed matter physics.
dc.titleELECTROREFLECTANCE IN SEMICONDUCTORS AND ITS APPLICATION AS A METHOD OF MATERIALS CHARACTERIZATION
dc.typeDissertation


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