Now showing items 1-2 of 2
Scanning Probe Microscopy Force Reconstruction from Non-Equilibrium Dynamics
(Yeshiva College, 2014-05)
Atomic Force Spectroscopy generates a voltage time trace which contains physical information of the sample under study. This information is hidden in the trace and a central challenge is the recovery of a force vs. ...
Determination of Charge and Size of Rings by Atomic Force Microscopy
(Yeshiva College, 2016-05)
We consider a charged ring probed by the tip sensor of an Atomic Force Microscope (AFM) and present a method to measure, from the force-vs.-separation curve, the charge and size of the ring. A number of systems of nano- ...