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    Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. 

    Tager, Jonathan Yehuda; Yeshiva University, degree granting institution. (New York, NY: Yeshiva College. Yeshiva University., 2020-05)
    In this paper we have considered the electrostatic force between a line of charge and a spherical AFM tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be used to measure, ...

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    AuthorTager, Jonathan Yehuda (1)
    Yeshiva University, degree granting institution. (1)
    Subject
    atomic force microscope (AFM) (1)
    electrostatic force (1)Senior honors thesis (1)... View MoreDate Issued2020 (1)Has File(s)Yes (1)

    Yeshiva University Libraries copyright © 2021  DuraSpace
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