Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors.

Abstract

In this paper we have considered the electrostatic force between a line of charge and a spherical AFM tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be used to measure, by fitting, the charge density of the line. These expressions and graphs should prove useful for an experimentalist operating an atomic force microscope. (from Conclusion)