In this paper we have considered the electrostatic force between a line of charge and a spherical AFM
tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be
used to measure, by fitting, the charge density of the line. These expressions and graphs should prove
useful for an experimentalist operating an atomic force microscope. (from Conclusion)
Tager, Jonathan Yehuda. Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. Thesis Submitted in Partial Fulfillment of the Jay and Jeanie Schottenstein Honors Program. NY: Yeshiva College Department of Physics. Yeshiva University, May 2020. [Advisor]: Professor Fredy Zypman.
*This is contructed from limited avaiable data and may be imprecise.