Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors.
| dc.contributor.advisor | Zypman, Fredy | |
| dc.contributor.author | Tager, Jonathan Yehuda | |
| dc.contributor.author | Yeshiva University, degree granting institution. | |
| dc.date.accessioned | 2020-06-12T20:21:43Z | |
| dc.date.available | 2020-06-12T20:21:43Z | |
| dc.date.issued | 2020-05 | |
| dc.identifier.citation | Tager, Jonathan Yehuda. Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. Thesis Submitted in Partial Fulfillment of the Jay and Jeanie Schottenstein Honors Program. NY: Yeshiva College Department of Physics. Yeshiva University, May 2020. [Advisor]: Professor Fredy Zypman. | en_US |
| dc.identifier.uri | https://hdl.handle.net/20.500.12202/5654 | |
| dc.description | Senior honors thesis. Open Access. | en_US |
| dc.description.abstract | In this paper we have considered the electrostatic force between a line of charge and a spherical AFM tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be used to measure, by fitting, the charge density of the line. These expressions and graphs should prove useful for an experimentalist operating an atomic force microscope. (from Conclusion) | en_US |
| dc.description.sponsorship | Jay and Jeanie Schottenstein Honors Program | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | New York, NY: Yeshiva College. Yeshiva University. | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | Senior honors thesis | en_US |
| dc.subject | atomic force microscope (AFM) | en_US |
| dc.subject | electrostatic force | en_US |
| dc.title | Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. | en_US |
| dc.type | Thesis | en_US |
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