Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors.

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dc.contributor.advisorZypman, Fredy
dc.contributor.authorTager, Jonathan Yehuda
dc.contributor.authorYeshiva University, degree granting institution.
dc.date.accessioned2020-06-12T20:21:43Z
dc.date.available2020-06-12T20:21:43Z
dc.date.issued2020-05
dc.descriptionSenior honors thesis. Open Access.en_US
dc.description.abstractIn this paper we have considered the electrostatic force between a line of charge and a spherical AFM tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be used to measure, by fitting, the charge density of the line. These expressions and graphs should prove useful for an experimentalist operating an atomic force microscope. (from Conclusion)en_US
dc.description.sponsorshipJay and Jeanie Schottenstein Honors Programen_US
dc.identifier.citationTager, Jonathan Yehuda. Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. Thesis Submitted in Partial Fulfillment of the Jay and Jeanie Schottenstein Honors Program. NY: Yeshiva College Department of Physics. Yeshiva University, May 2020. [Advisor]: Professor Fredy Zypman.en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12202/5654
dc.language.isoen_USen_US
dc.publisherNew York, NY: Yeshiva College. Yeshiva University.en_US
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/us/*
dc.subjectSenior honors thesisen_US
dc.subjectatomic force microscope (AFM)en_US
dc.subjectelectrostatic forceen_US
dc.titleForces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors.en_US
dc.typeThesisen_US

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