Charge calibration standard for atomic force microscope tips in liquids
dc.contributor.author | Zypman, Fredy | |
dc.contributor.author | Li, Li | |
dc.contributor.author | Steinmetz, Nicole F. | |
dc.contributor.author | Eppell, Steven J. | |
dc.contributor.orcid | 0000-0002-2033-3772 | en_US |
dc.date.accessioned | 2024-03-11T22:05:07Z | |
dc.date.available | 2024-03-11T22:05:07Z | |
dc.date.issued | 2020-11-17 | |
dc.description | Research article | en_US |
dc.description.abstract | An electric charge standard with nanoscale resolution is created using the known charge distribution of a single tobacco mosaic virus coat protein combined with the known packing of these proteins in the virus capsid. This advances the ability to measure charge on nanometric samples. Experimental atomic force microscope (AFM) force-distance curves are collected under aqueous conditions with controlled pH and ion concentration. A mathematical model that considers a polarizable dielectric tip immersed in an electrolyte is used to obtain charge density from the AFM measurements. Interactions between the tip and the sample are modeled using theory that includes monopolar electrostatic interactions, dipolar interactions, screening from both the dielectric nature of ambient water and solvated ions as described by the linear Poisson-Boltzmann equation, and hard-core repulsion. It is found that the tip charge density changes on a timescale of hours requiring recalibration of the tip for experiments lasting more than an hour. As an example of how a charge-calibrated tip may be used, the surface charge densities on 20 individual carboxylate-modified polystyrene (PS) beads are measured. The average of these AFM-measured bead charge densities is compared with the value obtained from conventional titration combined with electron microscopy. The two values are found to agree within 20%. While the comparison demonstrates similarity of the two charge measurements, hypotheses are put forward as to why the two techniques might be expected not to provide identical mean charge densities. The considerations used to build these hypotheses thus underscore the relevance of the method performed here if charge information is required on individual nanoparticles. | en_US |
dc.identifier.citation | Li, L., Steinmetz, N.F., Eppell, S.J., & Zypman, F.R. (2020, November 17) Charge calibration standard for atomic force microscope tips in liquids. Langmuir, 36(45), 13621-13632. | en_US |
dc.identifier.doi | https://doi.org/10.1021/acs.langmuir.0c02455 | en_US |
dc.identifier.issn | 07437463 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12202/9945 | |
dc.language.iso | en_US | en_US |
dc.relation.ispartofseries | Langmuir;36(45) | |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | electric charge standard | en_US |
dc.subject | nanoscale | en_US |
dc.subject | atomic force microscope (AFM) | en_US |
dc.subject | electron microscopy | en_US |
dc.title | Charge calibration standard for atomic force microscope tips in liquids | en_US |
dc.type | Article | en_US |
local.yu.facultypage | https://www.yu.edu/faculty/pages/zypman-fredy | en_US |