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    • Forces From Charged Chains On Dielectric And Conducting Atomic Force Microscopy Sensors. 

      Tager, Jonathan Yehuda; Yeshiva University, degree granting institution. (New York, NY: Yeshiva College. Yeshiva University., 2020-05)
      In this paper we have considered the electrostatic force between a line of charge and a spherical AFM tip. We considered both conducting tips as well as dielectric ones. The mathematical expressions can be used to measure, ...